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MEASUREMENT OF NANOSTRUCTURED POROUS SILICON POROSITY USING NANOINDENTOR / NORIDAH BINTI NORDIN

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    TA418.9.N35
    N67 2009
     
    1029961 (Shelf),SR
    Noridah Nordin

         MEASUREMENT OF NANOSTRUCTURED POROUS SILICON POROSITY USING NANOINDENTOR.

         xi, 36 pages : illustrations ; 30 cm.
         UiTM X Digitization.
         
         1. Nanostructured materials.I. Faculty of Applied Sciences. II. Title
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    1029961ShelfPERPUSTAKAAN TUN ABDUL RAZAK(P1)STUDENT PROJECTpp

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