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IEEE standard test access port and boundary-scan architecture / sponser, Test Technology Technical Committee of the IEEE Computer Society

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  • MARC

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    TK7874
    .I57 1993
     
    371662 (Shelf),BOK
    IEEE standard test access port and boundary-scan architecture. - New York, N.Y. , 1993.

         1 v. (various paging) : ill. ; 28 cm.
         SH16626--On cover.

         ISBN 1559373504.
         
         1. Integrated circuits - Testing - Standards.I. Institute of Electrical and Electronics Engineers. II. IEEE Standards Board. III. IEEE Computer Society. Test Technology Technical Committee IV. Title
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    371662ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKret

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