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Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China / sponsored by the IEEE Computer Society Test Technology Technical Committee in cooperation with China Computer Federation (CCF) ... [et al.]

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    TK7888.4
    .A85 1993
     
    371668 (Shelf),BOK
    Asian Test Symposium

         Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China. - Los Alamitos, Calif. , 1993.

         xii, 341 p. : ill. ; 28 cm.

         ISBN 081863930X.
         
         1. Electronic digital computers - Circuits - Testing - Congresses 2. Electrnic circuits - Testing - Congresses 3. Fault-tolerant computing - Congresses.I. IEEE Computer Society. Test Technology Technical Committee II. Title
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    371668ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKret

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