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Bridging faults and IDDQ testing / [edited] by Yashwant K. Malaiya and Rochit Rajsuman

  • Linear

  • MARC

  •  
    TK7871.99.M44
    B75 1992
     
    367823 (Shelf),BOK
    Bridging faults and IDDQ testing. - Los Alamitos, Calif. , l992.

         vi, 128 p. : ill. ; 28 cm IEEE Computer Society Press technology series.
         "Sponsored by the IEEE Computer Society Technical Commitee on Test Technology".

         ISBN 0818632151.
         
         1. Metal oxide semiconductors, Complementary - Testing - Data processing 2. Iddq testing.I. Malaiya, Yashwant K II. Rajsuman, Rochit III. IEEE Computer Society. Test Technology Technical Committee IV. Title V. Series
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    367823ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKret

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