VLSI electronics : microstructure science : VLSI Reliability / Anant G.Sabnis
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| | | | VLSI electronics : microstructure science : VLSI Reliability. - San Diego , 1990. | xiii, 207 p. : ill. ; 24 cm VLSI electronics v. 22. | Cover title:VLSI Reliability. | ISBN 0122341228. | | 1. Integrated circuits - Very large scale integration - Reliability.I. Title II. Series | | Library : UiTM Shah Alam |
| Accn No. | Item Status | Add Id | Location | SMD | Item Category | 334985 | Withdrawn | | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | RAK TERBUKA (OPEN SHELVES) | 334986 | Withdrawn | | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | RAK TERBUKA (OPEN SHELVES) | 334987 | Withdrawn | | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | RAK TERBUKA (OPEN SHELVES) | 334988 | Withdrawn | | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | RAK TERBUKA (OPEN SHELVES) | 334989 | Shelf | | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | ret | 368093 | Withdrawn | | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | RAK TERBUKA (OPEN SHELVES) |
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