Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael Lee Bushnell
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| | | | Neural models and algorithms for digital testing. - Boston , 1991. | xii, 184 p. : ill. ; 25 cm The Kluwer international series in engineering and computer science VLSI, computer architecture, and digital signal processing SECS 140. | Includes bibliographical references and index. | ISBN 0792391659. | | 1. Digital integrated circuits - Testing 2. Logic circuits - Testing 3. Automatic checkout equipment.I. Agrawal, Vishwani D.,1943- II. Bushnell, Michael Lee,1950- III. Title IV. Series | | Library : UiTM Shah Alam |
| Accn No. | Item Status | Add Id | Location | SMD | Item Category | 329903 | Shelf | | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | ret |
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