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Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael Lee Bushnell

  • Linear

  • MARC

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    TK7868.L6
    C44 1991
     
    329903 (Shelf),BOK
    Chakradhar, Srimat T

         Neural models and algorithms for digital testing. - Boston , 1991.

         xii, 184 p. : ill. ; 25 cm The Kluwer international series in engineering and computer science VLSI, computer architecture, and digital signal processing SECS 140.
         Includes bibliographical references and index.

         ISBN 0792391659.
         
         1. Digital integrated circuits - Testing 2. Logic circuits - Testing 3. Automatic checkout equipment.I. Agrawal, Vishwani D.,1943- II. Bushnell, Michael Lee,1950- III. Title IV. Series
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    329903ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKret

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