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IDDQ testing of VLSI circuits / edited by Ravi K. Gulati and Charles F. Hawkins

  • Linear

  • MARC

  •  
    TK7874
    .I3223 1993
     
    343949 (Shelf),BOK
    IDDQ testing of VLSI circuits. - Boston , 1993.

         120 p. : ill. ; 27 cm Frontiers in electronic testing.
         "Reprinted from Journal of electronic testing: theory and applications, vol. 3, no. 4"
         .DDQ is subscript in IDDQ in title; testing method also known as quiescent current testing.

         ISBN 0792393155.
         
         1. Metal oxide semiconductors, Complementary - Testing 2. Integrated circuits - Very large scale integration - Testing.I. Gulati, Ravi K II. Hawkins, Charles F III. Title IV. Series
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    343949ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKret

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