Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II : symposium held April 9-13, 2012, San Francisco, California, USA / editors Osamu Ueda ... [et al.]
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| | | | | Symposium G, "Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II": (2012: San Francisco, Calif.) |
| | Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II : symposium held April 9-13, 2012, San Francisco, California, USA. - rrendale, Pa , 2012. | | xiii, 195 p. : ill. ; 24 cm Materials Research Society symposium proceedings v. 1432. | | ISBN 9781605114095 (hbk.) | | .-ISBN 160511409X (hbk.). | | | | 1. Microelectronics - Congresse - Reliability 2. Semiconductors - Congresse - Materials 3. Materials - Congresse - Reliability.I. Ueda, Osamu II. Title III. Series | | | Library : UiTM Shah Alam |
| | Accn No. | Item Status | Add Id | Location | SMD | Item Category | | 974847 | Shelf | | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | RAK TERBUKA (OPEN SHELVES) |
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