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Modeling nanoscale imaging in electron microscopy / edited by Thomas Vogt, Wolfgang Dahmen, Peter Binev

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  • MARC

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    QH212.S34
    M63 2012
     
    940684 (Shelf),BOK
    Modeling nanoscale imaging in electron microscopy. - New York , 2012.

         ix, 182 p. : ill. (some col.) ; 24 cm Nanostructure science and technology.

         ISBN 9781461421900 (hbk.)
         .-ISBN 146142190X (hbk.).
         
         1. Scanning transmission electron microscopy - Simulation methods 2. Image analysis.I. Vogt, Thomas II. Dahmen, Wolfgang,1949- III. Binev, Peter IV. Title V. Series
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    940684ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKRAK TERBUKA (OPEN SHELVES)

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