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SAR image analysis, modeling, and techniques X : 21-23 September 2010, Toulouse, France / Claudia Notarnicola, editors ; sponsored by SPIE ; cooperating organisations, European Association of Remote Sensing Companies (Belgium) ... [et al.]

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    TK6592.S95
    S2643 2010
     
    912938 (Reference),Vol 7829,BOK
    SAR image analysis, modeling, and techniques X : 21-23 September 2010, Toulouse, France. - Bellingham, Wash. , 2010.

         1 v. (various pagings) : ill. ; 28 cm Proceedings of SPIE v. 7829.

         ISBN 9780819483461 (pbk.)
         .-ISBN 081948346X (pbk.).
         
         1. Remote sensing - Congresses 2. Synthetic aperture radar - Congresses - Image quality 3. Synthetic aperture radar - Congresses - Image quality 4. Infrared imaging - Congresses 5. Interferometry - Congresses.I. Notarnicola, Claudia II. European Association of Remote Sensing Companies. III. SPIE (Society). IV. Title V. Series
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    912938ReferenceVol 7829PERPUSTAKAAN ALAM BINA TUN ABDUL RAZAK(FSPU)BOOKruj

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