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Nanometer technology designs : high-quality delay tests / Mohammad Tehranipoor, Nisar Ahmed

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    TK7874
    .T44 2008
     
    845081 (Shelf),BOK
    Tehranipoor, Mohammad H. , 1974-

         Nanometer technology designs : high-quality delay tests. - New York , 2008.

         xvii, 281 p. : ill. ; 25 cm.

         ISBN 9780387764863 (hardcover : alk. paper)
         .-ISBN 0387764860 (hardcover : alk. paper).
         
         1. Integrated circuits - Testing 2. Integrated circuits - Very large scale integration 3. Nanotechnology.I. Ahmed, Nisar II. Title
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    845081ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKRAK TERBUKA (OPEN SHELVES)

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