Terrestrial neutron-induced soft errors in advanced memory devices / Takashi Nakamura ... [et al.]
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| | | | | Terrestrial neutron-induced soft errors in advanced memory devices. - Hackensack, NJ , 2008. |
| | xxii, 343 p. : ill. (some col.) ; 24 cm. | | Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges. | | ISBN 9789812778819 | | .-ISBN 9812778810. | | | | 1. Semiconductor storage devices 2. Neutron irradiation 3. Radiation dosimetry 4. Nuclear physics.I. Nakamura, Takashi - 1939- II. Title | | | Library : UiTM Shah Alam |
| | Accn No. | Item Status | Add Id | Location | SMD | Item Category | | 832010 | Shelf | | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | RAK TERBUKA (OPEN SHELVES) |
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