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Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor

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  • MARC

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    T174.7
    .E44 2008
     
    826608 (Shelf),BOK
    Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability.

         xii, 405 pages : illustrations ; 24 cm Frontiers in electronic testing v.37.

         ISBN 9780387747460
         .-ISBN 038774746X.
         
         1. Microtechnology 2. Nanotechnology.I. Tehranipoor, Mohammad II. Title III. Series
         Library : UiTM Shah Alam; UITM Pulau Pinang
    Accn No.Item StatusAdd IdLocationSMDItem Category
    826608ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKRAK TERBUKA (OPEN SHELVES)
    831780ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKRAK TERBUKA (OPEN SHELVES)
    845149ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKRAK TERBUKA (OPEN SHELVES)

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