Defect-oriented testing for nano-metric CMOS VLSI circuit / by Manoj Sachdev and Jose Pineda de Gyvez electronic resource
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| | | | | | Defect-oriented testing for nano-metric CMOS VLSI circuit. - Dordrecht , 2007. | | xxi, 328 p. : ill. ; 24 cm Frontiers in electronic testing 34. | | New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998. | | ISBN 9780387465463 (hd.bd.) | | .-ISBN 0387465464 (hd.bd.). | | | | 1. Metal oxide semiconductors, Complementary - Testing 2. Metal oxide semiconductors, Complementary - Defects - Defects 3. Integrated circuits - Very large scale integration - Testing 4. Integrated circuits - Very large scale integration - Defects.I. Sachdev, Manoj II. Pineda de Gyvez, Jose III. Title IV. Series | | | Library : UiTM Shah Alam; UITM Terengganu |
| | Accn No. | Item Status | Add Id | Location | SMD | Item Category | | 818770 | Shelf | | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | RAK TERBUKA (OPEN SHELVES) |
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