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Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp

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    QH212.A78
    K38 2006
     
    709767 (Shelf),BOK
    Kaupp, G.

         Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces. - Berlin , 2006.

         xii, 292 p. : ill. ; 24 cm Nanoscience and technology.

         ISBN 3540284052 (hd.bd.)
         .-ISBN 9783540284055 (hd.bd.).
         
         1. Near-field microscopy 2. Atomic force microscopy.I. Title II. Series
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    709767ShelfPERPUSTAKAAN TUN ABDUL RAZAK(P1)BOOKRAK TERBUKA (OPEN SHELVES)

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