Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / Sergei V. Kalinin, Alexei Gruverman, editors
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| | | Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale. - New York , 2007. |
| 2 v. (xx, 980 p.) : ill. (some col.) ; 25 cm. | ISBN 9780387286679 (2-v. set : hd.bd.) | .-ISBN 0387286675 (2-v. set : hd.bd.). | | 1. Scanning probe microscopy 2. Nanoelectronics.I. Kalinin, S. V. II. Gruverman, A. III. Title | | Library : UiTM Shah Alam; UITM Pulau Pinang |
| Accn No. | Item Status | Add Id | Location | SMD | Item Category | 688576 | Shelf | Vol 1 | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | RAK TERBUKA (OPEN SHELVES) | 688577 | Shelf | Vol 2 | PERPUSTAKAAN KEJURUTERAAN TAR(P3) | BOOK | RAK TERBUKA (OPEN SHELVES) |
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