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Microstructural characterization of materials / David Brandon and Wayne D. Kaplan

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  • MARC

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    TA417.23
    .B73 1999
     
    671798 (Shelf),BOK
    Brandon, David

         Microstructural characterization of materials. - Chichester;. - New York , 1999.

         xiii, 409 p. : ill. (some col.) ; 24 cm.

         ISBN 0471985015 (cloth : alk. paper)
         .-ISBN 0471985023 (paper : alk. paper)
         .-ISBN 9780471985020.
         
         1. Microstructure - Microscopy 2. Materials - Microscopy.I. Kaplan, Wayne D. II. Title
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    671798ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKRAK TERBUKA (OPEN SHELVES)

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