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Computed electron micrographs and defect identification. / by A. K. Head...[et al.]

  • Linear

  • MARC

  •  
    QD921
    .C62 1973
     
    106997 (Reference),BOK
    Computed electron micrographs and defect identification.. - Amsterdam , 1973.

         x, 400 p. with ill. ; 23 cm Defects in crystalline solids v. 7.

         ISBN 0444104623.
         
         1. Metals - Defects - Data processing 2. Electron microscopy - Data processing.I. Head, A. K II. Title III. Series
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    106997ReferencePERPUSTAKAAN TUN ABDUL RAZAK(P1)BOOKruj

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