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Infrared characterization for microelectronics / W.S. Lau

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    TK7871
    .L38 1999
     
    629930 (Shelf),BOK
    Lau, W. S

         Infrared characterization for microelectronics. - Singapore. - River Edge, NJ , 1999.

         x, 160 p. : ill. ; 23 cm.

         ISBN 9810223528.
         
         1. Absorption spectra 2. Infrared spectroscopy 3. Microelectronics - Materials - Testing.I. Title
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    629930ShelfPERPUSTAKAAN TUN ABDUL RAZAK(P1)BOOKRAK TERBUKA (OPEN SHELVES)

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