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Design and analysis of accelerated tests for mission critical reliability / by Michael J. LuValle, Bruce G. Lefevre, SriRaman Kannan

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  • MARC

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    TA169.3
    .L88 2004
     
    619564 (Shelf),BOK
    LuValle, Michael J

         Design and analysis of accelerated tests for mission critical reliability. - Boca Raton , 2004.

         236 p. : ill. ; 24 cm.

         ISBN 1584884711 (alk. paper).
         
         1. Reliability (Engineering) 2. Accelerated life testing.I. Lefevre, Bruce G II. Kannan, SriRaman III. Title
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    619564ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKRAK TERBUKA (OPEN SHELVES)
    624156ShelfPERPUSTAKAAN SAINS DAN TEKNOLOGI TAR(P4)BOOKRAK TERBUKA (OPEN SHELVES)

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