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Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman

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  • MARC

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    HD47.3
    .S38 2005
     
    616804 (Shelf),BOK
    Sato, Yoshihiko

         Value analysis tear-down : a new process for product development and innovation. - New York , 2005.

         p. cm.

         ISBN 0831132035 (professional/textbook : alk. paper).
         
         1. Engineering economy 2. Value analysis (Cost control) 3. New products 4. Industrial productivity.I. Kaufman, J. Jerry II. Title
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    616804ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKRAK TERBUKA (OPEN SHELVES)

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