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Analysis of residual stress by diffraction using neutron and synchrotron radiation / edited by M.E. Fitzpatrick and A. Lodini

  • Linear

  • MARC

  •  
    TA450
    .A53 2003
     
    593209 (Issued),BOK
    Analysis of residual stress by diffraction using neutron and synchrotron radiation. - London , 2003.

         xi, 354 p. : ill. ; 26 cm.

         ISBN 0415303974.
         
         1. X-rays - Diffraction 2. Residual stresses 3. Synchrotron radiation - Diffraction.I. Fitzpatrick, M. E. II. Lodini, Alain III. Title

         http://ptarpp2.uitm.edu.my/ptarpprack/RAK-15.gif
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    593209IssuedPTAR KAMPUS PUNCAK PERDANA(PP)BOOKRAK TERBUKA (OPEN SHELVES)

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