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Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer Arthur D. Friedman

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    TK7874
    .A23 1990
     
    367884 (Shelf),BOK
    Abramovici, Miron

         Digital systems testing and testable design. - New York, NY , l990.

         xxi, 653 p. : ill. ; 25 cm Electrical engineering, communications, and signal processing.

         ISBN 0780310624.
         
         1. Digital integrated circuits - Design and construction - Data processing 2. Digital integrated circuits - Testing.I. Breuer, Melvin A II. Friedman, Arthur D III. Title IV. Series
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    367884ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKret

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