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Materials reliability in microelectronics II : proceedings of the ... held April 27-May 1, 1992 / editors, C. V. Thompson, J. R. Lloyd

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    TK7874
    .S96 1992
     
    368703 (Shelf),BOK
    Symposium on Materials Reliability in Microelectronics II

         Materials reliability in microelectronics II : proceedings of the ... held April 27-May 1, 1992. - Pittsburgh, Penn. , l992.

         ix, 328 p. : ill. ; 24 cm Materials Research Society symposium proceedings v265.

         ISBN 1558991603.
         
         1. Microelectronics - Reliability - Congresses 2. Microelectronics - Materials - Testing - Congresses 3. Electrodiffusion - Congresses.I. Thompson, C. V. II. Lloyd, J. R. III. Title IV. Series
         Library : UiTM Shah Alam
    Accn No.Item StatusAdd IdLocationSMDItem Category
    368703ShelfPERPUSTAKAAN KEJURUTERAAN TAR(P3)BOOKret

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